In an attempt to avoid confusion, modules will now be referred to by
their (hybrid) serial numbers. All hybrids are now fitted with chips at Birmingham,
where they are also tested. See also the Hybrid Test Results
from Birmingham. In the case of irradiated hybrids or modules, see also the ATLAS SCT ASIC Irradiation
page.
|
Database S/N |
|
Chips |
Caps |
Glue |
Notes |
Location |
MODULE |
ABCD3T |
100nF |
Conductive |
Irradiated |
CERN |
||
ukk2 |
20220170100002 |
HYBRID |
thinned, metallised ABCD3T |
100nF |
Conductive |
Irradiated |
CERN |
- |
MODULE |
ABCD3T |
100nF |
Insulative |
- |
System Test |
|
- |
MODULE |
ABCD3T |
100nF |
Conductive |
- |
System Test |
|
- |
20220170100016 |
MODULE |
ABCD3TA |
220nF |
Conductive |
(Damaged) |
RAL |
- |
20220170100017 |
HYBRID |
ABCD3T |
220nF |
Conductive |
Fast Chips |
CERN |
- |
MODULE |
ABCD3TA |
220nF |
Conductive |
- |
System Test |
|
- |
MODULE |
ABCD3TA |
220nF |
Conductive |
- |
System Test |
|
- |
20220170100021 |
- |
- |
220nF |
- |
- |
Birmingham |
- |
20220170100027 |
- |
- |
220nF |
- |
to be returned |
Birmingham |
- |
20220170100028 |
HYBRID |
ABCD3T |
220nF |
Conductive |
- |
Birmingham |
| - | 20220170100034 | HYBRID | ABCD3TA | 220nF | Conductive | - | RAL |
Last update: 23.05.01
Contact Peter W Phillips