Module_Exchange Test of 20220040200006

Parameter	Minimum	Maximum	Final	Unit
T0	20.0	33.0	20.0	deg. C
T1	20.0	32.0	20.0	deg. C
VDET	200	500	500	V
IDET	1.65	2.521	2.060	microA
VCC	0.02	3.52	0.02	V
ICC	10	1020	10	mA
VDD	0.00	4.02	0.00	V
IDD	30	540	30	mA

Test Results

Test	Status	Comments	Links
HardReset	PASS	No defects
FullBypassTest	PASS	No defects
RedundancyTest	PASS	No defects
PipelineTest	PASS	No defects
StrobeDelay	PASS	Strobe Delay between 15 and 19 No defects
ThreePointGain	PASS	Gain between 56.2 and 63.1 mV/fC Noise between 1251 and 1416 ENC 1 defect	Postscript	Data as Text
TrimRangeScan	PASS	2 defects on range -1 2 channels masked on range 0: 134 824	Postscript	Trim range 0 Trim range 1 Trim range 2 Trim range 3 Trim range -1	Mask range 0 Mask range 1 (empty) Mask range 2 (empty) Mask range 3 (empty) Mask range -1 (empty)
ResponseCurve	PASS	Gain between 56.5 and 60.1 mV/fC Noise between 1317 and 1416 ENC 2 defects	Postscript	Data as Text
NO	PASS	Noise Occupancy at 1fC between 4.5e-007 and 2.3e-006 Estimated ENC between 1242 and 1339 No defects	Postscript
Timewalk	PASS	Timewalk between 15 and 19 nS No defects	Postscript
ModIVScan	PASS	Leakage 0.963 microA at 150V Leakage 1.660 microA at 350V Leakage 2.521 microA at 500V No defects	Postscript	Data as Text
ModIVScan	PASS	Leakage 0.861 microA at 150V Leakage 1.394 microA at 350V Leakage 2.091 microA at 500V No defects	Postscript	Data as Text
ModIVScan	PASS	Leakage 0.830 microA at 150V Leakage 1.322 microA at 350V Leakage 2.060 microA at 500V No defects	Postscript	Data as Text

Results file 20020715
Results file 20020716