| Parameter | Minimum | Maximum | Final | Unit |
|---|---|---|---|---|
| T0 | 23.0 | 26.0 | 26.0 | deg. C |
| T1 | 23.0 | 27.0 | 27.0 | deg. C |
| VDET | 199.9 | 500 | 199.9 | V |
| IDET | 0.8 | 16.410 | 1.01 | microA |
| VCC | 0.02 | 3.52 | 3.50 | V |
| ICC | 10 | 830 | 780 | mA |
| VDD | 0.00 | 4.02 | 4.00 | V |
| IDD | 30 | 560 | 520 | mA |
Test Results
| Test | Status | Comments | Links | ||
|---|---|---|---|---|---|
| ModIVScan | PASS | Leakage 0.799 microA at 150V Leakage 1.189 microA at 350V Leakage 1.302 microA at 500V No defects |
Postscript | Data as Text | |
| HardReset | PASS | No defects | |||
| FullBypassTest | PASS | No defects | |||
| RedundancyTest | PASS | No defects | |||
| PipelineTest | PASS | No defects | |||
| StrobeDelay | FAIL | Strobe Delay between -1 and 16 4 defects |
|||
| ThreePointGain | PASS | Gain between 0.0 and 58.9 mV/fC Noise between 0 and 1495 ENC 5 defects |
Postscript | Data as Text | |
| TrimRangeScan | FAIL |
4 defects on range -1
513 channels masked on range 0: 512 channels masked on range 1: 512 channels masked on range 2: 512 channels masked on range 3: 512 channels masked on range -1: |
Postscript | Trim range 0 Trim range 1 Trim range 2 Trim range 3 Trim range -1 |
Mask range 0 Mask range 1 Mask range 2 Mask range 3 Mask range -1 |
| ResponseCurve | PASS | Gain between 0.0 and 57.5 mV/fC Noise between 0 and 1448 ENC 5 defects |
Postscript | Data as Text | |
| NO | PASS | Noise Occupancy at 1fC between 0.0e+000 and 4.9e-004 Estimated ENC between 0 and 1821 40 defects |
Postscript | ||
| Timewalk | FAIL | Timewalk between -1 and 16 nS 4 defects |
Postscript |