| Parameter | Minimum | Maximum | Final | Unit |
|---|---|---|---|---|
| T0 | 18.0 | 19.0 | 19.0 | deg. C |
| T1 | 18.0 | 19.0 | 19.0 | deg. C |
| VDET | 0 | 500 | 0.0 | V |
| IDET | 0.000 | 0.031 | 0.0 | microA |
| VCC | 0.02 | 3.50 | 3.5 | V |
| ICC | 10 | 1000 | 960.0 | mA |
| VDD | 0.00 | 4.00 | 4.0 | V |
| IDD | 30 | 510.0 | 480.0 | mA |
Test Results
| Test | Status | Comments | Links | ||
|---|---|---|---|---|---|
| HardReset | PASS | No defects | |||
| FullBypassTest | PASS | No defects | |||
| RedundancyTest | PASS | No defects | |||
| PipelineTest | PASS | No defects | |||
| StrobeDelay | PASS | Strobe Delay between 15 and 18 No defects |
|||
| ThreePointGain | PASS | Gain between 54.1 and 61.2 mV/fC Noise between 576 and 637 ENC No defects |
Postscript | Data as Text | |
| TrimRangeScan | PASS |
6 defects on range -1
5 channels masked on range 0: 85 228 229 871 1133 1 channels masked on range 1: 1133 |
Postscript | Trim range 0 Trim range 1 Trim range 2 Trim range 3 Trim range -1 |
Mask range 0 Mask range 1 Mask range 2 (empty) Mask range 3 (empty) Mask range -1 (empty) |
| ResponseCurve | PASS | Gain between 53.2 and 61.3 mV/fC Noise between 543 and 592 ENC No defects |
Postscript | Data as Text | |
| NO | PASS | Noise Occupancy at 1fC between 0.0e+000 and 0.0e+000 Estimated ENC between 542 and 2208 No defects |
Postscript | ||
| Timewalk | PASS | Timewalk between 15 and 18 nS No defects |
Postscript | ||
| NO | PASS | Noise Occupancy at 1fC between 0.0e+000 and 0.0e+000 Estimated ENC between 534 and 600 No defects |
Postscript | ||
| ModIVScan | PASS | Leakage 0.020 microA at 150V Leakage 0.031 microA at 350V No defects |
Postscript | Data as Text | |
| HardReset | PASS | No defects | |||
| FullBypassTest | PASS | No defects | |||
| RedundancyTest | PASS | No defects | |||
| StrobeDelay | PASS | Strobe Delay between 15 and 18 No defects |
|||
| ThreePointGain | PASS | Gain between 51.7 and 60.3 mV/fC Noise between 553 and 612 ENC 1 defect |
Postscript | Data as Text |