Module_LongTerm Test of 20220170100016

DCS Summary

Parameter Minimum Maximum Final Unit
T0 -2.0 5.0 -2.0 deg. C
T1 -2.0 5.0 5.0 deg. C
VDET -1.0 150.0 -1.0 V
IDET 0.16 6.0 6.0 microA
VCC 3.48 840 840 V
ICC 830 900 850 mA
VDD 3.48 530 530 V
IDD 480 570 560 mA

Test Results - NOTE THAT THIS MODULE HAS FOUR DEAD CHIPS!

Test Status Comments Links    
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 17
4 defects
     
ThreePointGain PASS Gain between 0.0 and 61.8 mV/fC
Noise between 0 and 1444 ENC
5 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 62.8 mV/fC
Noise between 0 and 1410 ENC
5 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 62.8 mV/fC
Noise between 0 and 1391 ENC
5 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 63.2 mV/fC
Noise between 0 and 1380 ENC
6 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 62.7 mV/fC
Noise between 0 and 1403 ENC
6 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 62.9 mV/fC
Noise between 0 and 1387 ENC
5 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 63.0 mV/fC
Noise between 0 and 1376 ENC
7 defects
Postscript Data as Text  
FullBypassTest PASS No defects      
RedundancyTest PASS No defects      
PipelineTest PASS No defects      
StrobeDelay FAIL Strobe Delay between -1 and 18
4 defects
     
ThreePointGain PASS Gain between 0.0 and 62.8 mV/fC
Noise between 0 and 1392 ENC
5 defects
Postscript Data as Text  
TrimRangeScan FAIL 5 defects on range -1
514 channels masked on range 0:
512 channels masked on range 1:
512 channels masked on range 2:
512 channels masked on range 3:
512 channels masked on range -1:
Postscript Trim range 0
Trim range 1
Trim range 2
Trim range 3
Trim range -1
Mask range 0
Mask range 1
Mask range 2
Mask range 3
Mask range -1
ResponseCurve PASS Gain between 0.0 and 62.3 mV/fC
Noise between 0 and 1429 ENC
6 defects
Postscript Data as Text  
NO PASS Noise Occupancy at 1fC between 0.0e+000 and 5.2e-006
Estimated ENC between 0 and 1398
No defects
Postscript    
Timewalk FAIL Timewalk between -1 and 18 nS
4 defects
Postscript    
Longterm

PASS

  Postscript Data as Text  

Results file 20020418
Results file 20020419